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Estimating Measurement Uncertainty

Technical Report 346

Erwin Achermann, Oscar Chinellato, Institute of Scientific Computing, ETH Zürich

Keywords: Function Fitting, EIV, Measurement Uncertainty, Calibration
Language: English
Pages: 14
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Abstract: Most analytical methods are relative and hence require calibration. Calibration measurements are normally performed with reference materials or calibration standards. Typically least squares methods have been employed in such a manner as to ignore uncertainties associated with the calibration standards. However different authors have shown that by taking into account the uncertainties associated with the calibration standards, better approximations to the model are possible.

We show a complete, numerically stable and fast way to compute the "Maximum Likelihood (fitting of a) Functional Relationship" (MLFR).

Jul . 2000

ETH Zürich